Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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Lala writes in a user-friendly and testabiilty style, making the book easy to read, even for the newcomer to fault-tolerant system design.
See 2 questions about Digital Circuit Testing and Testability…. It presents coverage of self checking logic design at the gate and the transistor level; discusses the latest techniques for testing state machines; and includes detailed coverage of memory testing.
Digital Circuit Testing and Testability
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Digital circuit testing and testability (Book, ) 
Subjects Integrated circuitsDugitalVery large scale integrationDigital integrated circuitsFault tolerance. Ashok Kumar rated it really liked it Dec 13, Last edited by IdentifierBot.
It presents coverage of self checking logic design at the gate and the transistor testabilit dis Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that lqla tolerant of faults. Edition Notes Includes bibliographical references and index. This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant.
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Digital circuit testing and testability
Shubham Wasnik rated it really liked it Apr 29, Open Preview See a Problem? Extensive references follow each testabiility, making further research in a particular area readily available.
Rededa rated it really liked it Nov 21, Digital circuit testing and testability Close. Design of Testable Sequential Circuits. History Created April 1, 6 revisions Download catalog record: Access Online via Elsevier Amazon.
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Digital Circuit Testing and Testability – Parag K. Lala – Google Books
The name field is required. Angeline rated it liked it Oct 29, Parag K Lala Publisher: Mustaq Ahmad rated it liked it Feb 03, Please enter the message. Malathi rated it it was amazing Dec 06, Classifications Dewey Decimal Class Testable Combinational Logic Circuit Design. User Review – Flag as inappropriate very useful book for testing of vlsi.
Hardcoverpages. Books by Parag K.